The resistance of a (Xe)n atomic wire
Centre d'Élaboration de Matériaux et d'Études Structurales, UPR CNRS 8011, 29, rue Jeanne-Marvig, B.P. 4347, F-31055 Toulouse Cedex 4, France
2 Laboratoire de Physique Moléculaire, URA CNRS 772, Université de Franche-Comté - F-25030 Besançon Cedex, France
Accepted: 28 February 1997
The electrical resistances of different atomic wires are calculated. For Xe and , confined in the gap of a scanning tunneling microscope junction, the dynamics of the xenon atoms upon approaching the probe tip is included. With a single Xe, in agreement with the recent work of Yazdani et al. (Science, 272 (1996) 1921), a resistance of is found. The resistance of ranges between and due to both mechanical deformations and electronic interferences. Finally, for longer wires, the resistance displays an exponential behavior with respect to n and an inverse damping length of , very close to that of an alkane chain, is predicted.
PACS: 61.16.Ch – Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc / 61.20.Lc – Time-dependent properties; relaxation / 72.80.-r – Conductivity of specific materials
© EDP Sciences, 1997