Phase composition and stress in LiTaO3 proton-exchanged optical waveguides
Institute of Solid State Physics, Bulgarian Academy of Sciences - 72 Tzarigradsko Chaussee Blvd., 1784 Sofia, Bulgaria, EU
Received: 23 July 2013
Accepted: 18 September 2013
The phase composition of the top layer of Li1−xHxTaO3 waveguide layers produced at different modifications of the proton exchange (PE) technology has been analyzed based on their IR reflection spectra. These spectra contain new bands within the range , each phase having its own reflection spectrum. Since the top layer is actually the strongest proton-exchanged one of all sublayers building the waveguide layer, the recognition of the top sublayer's phase in many cases could be used to make conclusions about the phases building the rest of the entire PE layer. The intrinsic stress caused by crystal lattice deformation due to the PE was calculated by an optical integral method. An attempt to explain the level of stress is made based on the phase composition of the studied samples.
PACS: 78.20.-e – Optical properties of bulk materials and thin films / 78.30.-j – Infrared and Raman spectra / 81.05.-t – Specific materials: fabrication, treatment, testing, and analysis
© EPLA, 2013