Spontaneous emission of a two-level system near the interface of topological insulators
1 Key Laboratory of Advanced Micro-structure Materials, Ministry of Education, School of Physics Science and Engineering, Tongji University - Shanghai 200092, PRC
Received: 18 October 2013
Accepted: 19 February 2014
Spontaneous emission of a two-level system near the interface of topological insulators (TIs) is investigated. Because of the topological magnetoelectric (TME) effect of the TI, the decay rates near a TI interface are substantially inhibited in comparison with that near a dielectric interface, especially for parallel dipole. The influences of topological magnetoelectric polarizability on decay rates through the radiative mode and decay rates through the evanescent mode have been analyzed in detail. Decay through dissipation has also been considered. We provide a new way to control the spontaneous emission by using TIs and this could be used to confirm the TME effect.
PACS: 42.50.Ct – Quantum description of interaction of light and matter; related experiments / 78.20.-e – Optical properties of bulk materials and thin films / 03.65.Vf – Phases: geometric; dynamic or topological
© EPLA, 2014