Issue Europhys. Lett. Volume 63, Number 2, July 2003 Page(s) 275 - 281 Section Condensed matter: structure, mechanical and thermal properties DOI 10.1209/epl/i2003-00526-5

DOI: 10.1209/epl/i2003-00526-5
Europhys. Lett., 63 (2) , pp. 275-281 (2003)

X-ray super-cell crystallography of self-organized deposits

O. Fruchart¹, G. Renaud², A. Barbier^{2, 3}, M. Noblet², O. Ulrich², J.-P. Deville⁴, F. Scheurer⁴, J. Mane-Mane⁴, V. Repain⁵, G. Baudot⁵ and S. Rousset<sup>5

1</sup>  Laboratoire Louis Néel (CNRS), UPR5051, BP166 F-38042 Grenoble Cedex 9, France
²  DRFMC/SP2M/IRS (CEA) - 17 rue des Martyrs, F-38054 Grenoble Cedex 9, France
³  DRECAM/SPCSI (CEA) - 91191 Gif-Sur-Yvette, France
⁴  Institut de Physique et Chimie des Matériaux de Strasbourg UMR7504 CNRS-Université Louis Pasteur - 23 rue du Loess F-67037 Strasbourg Cedex, France
⁵  Groupe de Physique du Solide, UMR 7588 - 4 pl. de Jussieu F-75231 Paris Cedex 05, France

Olivier.Fruchart@grenoble.cnrs.fr

(Received 9 January 2003; accepted in final form 22 May 2003)

Abstract
We report in situ Grazing Incidence Small Angle X-ray Scattering (GISAXS), performed on self-organized deposits during growth. The surface reciprocal space associated with the dots periodicity ( ) is investigated. The quantitative combination of GISAXS and STM yields non-destructive information about buried layers. For , a periodic interfacial microstructure persists even after the film free-surface smoothing is observed.

PACS
68.65.-k - Low-dimensional, mesoscopic, and nanoscale systems: structure and nonelectronic properties.
68.55.Ac - Nucleation and growth: microscopic aspects.
61.10.Eq - X-ray scattering (including small-angle scattering).

© EDP Sciences 2003

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