Buckling patterns of gold thin films on silicon substrates: Formation of superimposed blistersJ. Colin, C. Coupeau, J. Durinck and J. Grilhé
PHYMAT-CNRS UMR 6630, Université de Poitiers - BP 30179, 86962 Futuroscope Cedex, France, EU
received 10 March 2009; accepted in final form 8 May 2009; published June 2009
published online 9 June 2009
Buckling phenomena leading to the formation of superimposed blisters have been experimentally observed with the help of a confocal interferometric microscope onto the surface of gold thin films deposited on silicon substrates. Assuming that residual folding effects resulting from plastic deformation mechanisms take place in the film during its morphological evolution, different probable scenarios for the formation of the observed buckling patterns are elaborated in the framework of the Föppl-von Karman's theory of thin plates. Multi-step buckling with growing interface delamination is considered for the first scenario while a single or multi-step buckling at a given delamination width is assumed for the other ones.
46.32.+x - Static buckling and instability.
68.55.-a - Thin film structure and morphology.
61.72.Lk - Linear defects: dislocations, disclinations.
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