Issue |
EPL
Volume 135, Number 6, September 2021
|
|
---|---|---|
Article Number | 67003 | |
Number of page(s) | 7 | |
Section | Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties | |
DOI | https://doi.org/10.1209/0295-5075/ac2d55 | |
Published online | 17 November 2021 |
Impact of Ar:O2 gas flow ratios on microstructure and optical characteristics of CeO2-doped ZnO thin films by magnetron sputtering
1 Centre of Nanotechnology, Indian Institute of Technology Roorkee - Roorkee 247667, India
2 Department of Physics, Faculty of science, Jazan University - Jazan 45142, Saudi Arabia
3 Department of chemical engineering, college of Applied Industrial Technology - Jazan 45971, Saudi Arabia
4 Department of Physics, College of Science, Al-Zulfi, Majmaah University - Al-Majmaah-11952, Saudi Arabia
5 Department of Biology, college of science, Imam Mohammad Ibn Saud Islamic University (IMSIU) Riyadh-11623, Saudi Arabia
6 Department of Physics, Indian Institute of Technology Guwahati - Guwahati 781039, India
7 Department of Biophysics, Institute for Research and Medical Consultations (IRMC), Imam Abdulrahman Bin Faisal University - P.O. Box 1982, 31441, Dammam, Saudi Arabia
8 Department of Chemical Engineering, Faculty of Engineering, Jazan University - Jazan 45142, Saudi Arabia
(a) aligshariq@gmail.com (corresponding author)
(b) ms.khan@mu.edu.sa
Received: 12 May 2021
Accepted: 5 October 2021
In this study, a radio frequency magnetron sputtering technique was applied to deposit eminently oriented ZnO thin films on stainless steel (SS316L). The effect of different ratios (Ar:O2) of gas flow ((20:0), (15:5), (10:10), (5:15), (0:20)) on optical and structural properties of CeO2-doped ZnO thin films has been examined. The increase in grain size of thin films was observed with a partial increase in the Ar:O2 sputtering gas at substrate temperature of 673 K. The average surface roughness of the thin films has increased with sputtering gas. The photoluminescence peak exhibited a broad green-yellow band spiked at 467 nm for all the samples of CeO2-doped ZnO thin films and a wide band of visible light focused in the 500–600 nm range. Intensity reduction of deep level emission peaks of ZnO films was observed. The refractive index of undoped and CeO2-doped ZnO thin films with various sputtering gas ratios (Ar:O2) were also investigated. The optimized argon gas flow rate findings allow us to choose the deposition conditions for CeO2-doped ZnO thin films for solar thermal applications.
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