Electrical breakdown in a V2O3 device at the insulator-to-metal transitionS. Guénon, S. Scharinger, Siming Wang, J. G. Ramírez, D. Koelle, R. Kleiner and Ivan K. SchullerEPL, 101 5 (2013) 57003DOI: https://doi.org/10.1209/0295-5075/101/57003
