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Expanding the measurement range of a critical-angle refractometer through Fourier analysis

Junwei Ye, Min Xia, Hao Liu, Wei Li, Wenping Guo, Changxin Xiong and Kecheng Yang

EPL, 104 2 (2013) 20001

DOI: https://doi.org/10.1209/0295-5075/104/20001

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