Expanding the measurement range of a critical-angle refractometer through Fourier analysisJunwei Ye, Min Xia, Hao Liu, Wei Li, Wenping Guo, Changxin Xiong and Kecheng YangEPL, 104 2 (2013) 20001DOI: https://doi.org/10.1209/0295-5075/104/20001