Atomistic two-temperature modelling of ion track formation in silicon dioxideA. A. Leino, S. L. Daraszewicz, O. H. Pakarinen, K. Nordlund and F. DjurabekovaEPL, 110 1 (2015) 16004DOI: https://doi.org/10.1209/0295-5075/110/16004