Calibrated force measurement in atomic force microscopy using the transient fluctuation theoremSamuel Albert, Aubin Archambault, Artyom Petrosyan, Caroline Crauste-Thibierge, Ludovic Bellon and Sergio CilibertoEPL, 131 1 (2020) 10008DOI: https://doi.org/10.1209/0295-5075/131/10008