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Calibrated force measurement in atomic force microscopy using the transient fluctuation theorem

Samuel Albert, Aubin Archambault, Artyom Petrosyan, Caroline Crauste-Thibierge, Ludovic Bellon and Sergio Ciliberto

EPL, 131 1 (2020) 10008

DOI: https://doi.org/10.1209/0295-5075/131/10008

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