Microdiffraction imaging of dislocation densities in microstructured samplesD. Lübbert, T. Baumbach, V. Holý, P. Mikulík, L. Helfen, P. Pernot, M. Elyyan, S. Keller, T. M. Katona, S. P. DenBaars and J. S. SpeckEPL, 82 5 (2008) 56002DOI: https://doi.org/10.1209/0295-5075/82/56002