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Pressure-induced americium valence fluctuations revealed by electrical resistivity

A. V. Kolomiets, J.-C. Griveau, S. Heathman, A. B. Shick, F. Wastin, P. Faure, V. Klosek, C. Genestier, N. Baclet and L. Havela

EPL, 82 5 (2008) 57007

DOI: https://doi.org/10.1209/0295-5075/82/57007

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