Revealing stacking sequences in inverse opals by microradian X-ray diffractionA. Sinitskii, V. Abramova, N. Grigorieva, S. Grigoriev, A. Snigirev, D. V. Byelov and A. V. PetukhovEPL, 89 1 (2010) 14002DOI: https://doi.org/10.1209/0295-5075/89/14002
