Selecting the tip electron orbital for scanning tunneling microscopy imaging with sub-ångström lateral resolutionA. N. Chaika, S. S. Nazin, V. N. Semenov, S. I. Bozhko, O. Lübben, S. A. Krasnikov, K. Radican and I. V. ShvetsEPL, 92 4 (2010) 46003DOI: https://doi.org/10.1209/0295-5075/92/46003