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Mechanisms of damage formation in Eu-implanted GaN probed by X-ray diffraction

B. Lacroix, S. Leclerc, A. Declémy, K. Lorenz, E. Alves and P. Ruterana

EPL, 96 4 (2011) 46002

DOI: https://doi.org/10.1209/0295-5075/96/46002

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