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Two-layer behaviour during low-energy ion ablation of CdTe(001) studied by in situ X-ray diffraction and by Monte Carlo simulation

V. H. Etgens, R. M. Ribeiro-Teixeira, P. M. Mors, M. B. Veron, S. Tatarenko, M. Sauvage-Simkin, J. Alvarez and S. Ferrer

Europhys. Lett., 36 4 (1996) 271-276

DOI: https://doi.org/10.1209/epl/i1996-00221-7

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