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Observation of the Huygens-principle growth mechanism in sputtered W/Si multilayers

T. Salditt, D. Lott, T. H. Metzger, J. Peisl, R. Fischer, J. Zweck, P. Høghøj, O. Schärpf and G. Vignaud

Europhys. Lett., 36 8 (1996) 565-570

DOI: https://doi.org/10.1209/epl/i1996-00270-x

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