Linear temperature variation of the penetration depth in YBa2Cu3O7-δ thin filmsL. A. de Vaulchier, J. P. Vieren, Y. Guldner, N. Bontemps, R. Combescot, Y. Lemaître and J. C. MageEurophys. Lett., 33 2 (1996) 153-158DOI: https://doi.org/10.1209/epl/i1996-00314-9
