Defect-mediated kinetic roughening in low-temperature MBE growth of Si/Si (111)B. Gallas, I. Berbezier, J. Derrien, D. Gandolfo, J. Ruiz and V. A. ZagrebnovEurophys. Lett., 41 5 (1998) 519-524DOI: https://doi.org/10.1209/epl/i1998-00184-7
