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Defect-mediated kinetic roughening in low-temperature MBE growth of Si/Si (111)

B. Gallas, I. Berbezier, J. Derrien, D. Gandolfo, J. Ruiz and V. A. Zagrebnov

Europhys. Lett., 41 5 (1998) 519-524

DOI: https://doi.org/10.1209/epl/i1998-00184-7

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