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Temperature-dependent resistivity of single-wall carbon nanotubes

C. L. Kane, E. J. Mele, R. S. Lee, J. E. Fischer, P. Petit, H. Dai, A. Thess, R. E. Smalley, A. R. M. Verschueren, S. J. Tans and C. Dekker

Europhys. Lett., 41 6 (1998) 683-688

DOI: https://doi.org/10.1209/epl/i1998-00214-6

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