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Composition profiling in a binary polymer blend thin film using polarized neutron reflectivity

H. Grüll, A. Schreyer, N. F. Berk, C. F. Majkrzak and C. C. Han

Europhys. Lett., 50 1 (2000) 107-112

DOI: https://doi.org/10.1209/epl/i2000-00242-8

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