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Structural characterization of cubic silicon nitride

J. Z. Jiang, K. Ståhl, R. W. Berg, D. J. Frost, T. J. Zhou and P. X. Shi

Europhys. Lett., 51 1 (2000) 62-67

DOI: https://doi.org/10.1209/epl/i2000-00337-8

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