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Imaging of stored charges in Si quantum dots by tapping and electrostatic force microscopy

C. Guillemot, P. Budau, J. Chevrier, F. Marchi, F. Comin, C. Alandi, F. Bertin, N. Buffet, Ch. Wyon and P. Mur

Europhys. Lett., 59 4 (2002) 566-571

DOI: https://doi.org/10.1209/epl/i2002-00143-x

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