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Hole doping dependence of the coherence length in _x thin films

H. H. Wen, H. P. Yang, S. L. Li, X. H. Zeng, A. A. Soukiassian, W. D. Si and X. X. Xi

Europhys. Lett., 64 6 (2003) 790-796

DOI: https://doi.org/10.1209/epl/i2003-00627-1

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