Nanoscale observation of delayering in alkane films

M. Bai, K. Knorr, M. J. Simpson, S. Trogisch, H. Taub, S. N. Ehrlich, H. Mo, U. G. Volkmann and F. Y. Hansen
EPL, 79 2 (2007) 26003
DOI: 10.1209/0295-5075/79/26003

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