EPL

In situ surface-sensitive X-ray investigations of thin quench condensed bismuth films

C. Markert, D. Lützenkirchen-Hecht, R. Wagner and R. Frahm

EPL, 86 4 (2009) 46007

Published online: 05 June 2009

DOI: 10.1209/0295-5075/86/46007

C. Markert

D. Lützenkirchen-Hecht

R. Wagner

R. Frahm

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