EPL

Direct micro-imaging of point defects in bulk SiO₂, applied to vacancy diffusion and clustering

E. Suhovoy, V. Mishra, M. Shklyar, L. Shtirberg and A. Blank

EPL, 90 2 (2010) 26009

Published online: 20 May 2010

DOI: 10.1209/0295-5075/90/26009

E. Suhovoy

V. Mishra

M. Shklyar

L. Shtirberg

A. Blank

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)