EPL

Defect-mediated kinetic roughening in low-temperature MBE growth of Si/Si (111)

B. Gallas, I. Berbezier, J. Derrien, D. Gandolfo, J. Ruiz and V. A. Zagrebnov

Europhys. Lett., 41 5 (1998) 519-524

Published online: 01 September 2002

DOI: 10.1209/epl/i1998-00184-7

B. Gallas

I. Berbezier

J. Derrien

D. Gandolfo

J. Ruiz

V. A. Zagrebnov

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