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Determination of micrometer length scales with an X-ray reflection ultra small-angle scattering set-up

P. Müller-Buschbaum, M. Casagrande, J. Gutmann, T. Kuhlmann, M. Stamm, G. von Krosigk, U. Lode, S. Cunis and R. Gehrke

Europhys. Lett., 42 5 (1998) 517-522

Published online: 01 September 2002

DOI: 10.1209/epl/i1998-00282-0

P. Müller-Buschbaum

M. Casagrande

J. Gutmann

T. Kuhlmann

M. Stamm

G. von Krosigk

U. Lode

S. Cunis

R. Gehrke

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Editor-in-Chief: Prof. Richard Blythe - Editorial board
ISSN: 0295-5075 - eISSN: 1286-4854
Frequency: semi-monthly
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