EPL

Retention loss in the ferroelectric (SrBi₂Ta₂O₉)-insulator (HfO₂)-silicon structure studied by piezoresponse force microscopy

Z. H. Zhang, X. L. Zhong, Y. Zhang, J. B. Wang, C. J. Lu, W. N. Ye and Y. C. Zhou

EPL, 98 2 (2012) 27011

Published online: 30 April 2012

DOI: 10.1209/0295-5075/98/27011

Z. H. Zhang

X. L. Zhong

Y. Zhang

J. B. Wang

C. J. Lu

W. N. Ye

Y. C. Zhou

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