Evidence of 3D-XY critical behaviour in La2-xSrxCuO4 films Y. Jaccard, T. Schneider, J.-P. Locquet, E. J. Williams, P. Martinoli and Ø. Fischer Europhys. Lett., 34 4 (1996) 281-286 Published online: 01 September 2002 DOI: 10.1209/epl/i1996-00451-1