Mechanisms of damage formation in Eu-implanted GaN probed by X-ray diffraction B. Lacroix, S. Leclerc, A. Declémy, K. Lorenz, E. Alves and P. Ruterana EPL, 96 4 (2011) 46002 Published online: 04 November 2011 DOI: 10.1209/0295-5075/96/46002