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Observation of the Huygens-principle growth mechanism in sputtered W/Si multilayers

T. Salditt, D. Lott, T. H. Metzger, J. Peisl, R. Fischer, J. Zweck, P. Høghøj, O. Schärpf and G. Vignaud

Europhys. Lett., 36 8 (1996) 565-570

Published online: 01 September 2002

DOI: 10.1209/epl/i1996-00270-x

T. Salditt

D. Lott

T. H. Metzger

J. Peisl

R. Fischer

J. Zweck

P. Høghøj

O. Schärpf

G. Vignaud

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Editor-in-Chief: Professor Bart van Tiggelen - Editorial board
ISSN: 0295-5075 - eISSN: 1286-4854
Frequency: semi-monthly
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