Electrical resistance of a single carbon nanotube
Institute of Microelectronics Technology and High Purity Materials, RAS,
Chernogolovka 142432, Russia
2 Laboratoire de Physique des Solides associé au CNRS, URA 002, Bâtiment 510, Université Paris-Sud - 91405 Orsay, France
Accepted: 1 April 1996
A single multiwalled carbon nanotube with an outside diameter of about 12 nm and an inside diameter of about 4 nm has been isolated in order to measure its electrical properties (resistivity, transverse magnetoresistance and temperature dependence of resistance). The semi-metallic character of the conductance of the selected nanotube is concluded from these measurements.
PACS: 68.70.+w – Whiskers and dendrites (growth, structure, and nonelectronic properties) / 72.20.My – Galvanomagnetic and other magnetotransport effects / 73.25.+i – Surface conductivity and carrier phenomena
© EDP Sciences, 1996