Simulation of a scanned tip on a NaF(001) surface in friction force microscopy
Institute of Applied Physics and Microstructure Research Center,
Hamburg, Jungiusstr. 11, D-20355 Hamburg, Germany
Accepted: 27 August 1996
The profiling process of a friction force microscope (FFM) tip scanning a NaF (001) surface is simulated using a simple model for the FFM based on the solution of the equations of motion. Complete friction force microscopy images as well as individual scan lines are calculated using a model potential for the tip-sample interaction. The nature of the movement of the tip in the interaction potential is analysed and demonstrates the two-dimensional character of the occurring lateral forces. Comparison with recent experimental studies shows good agreement of simulations and experimentally obtained data.
PACS: 07.79.Sp – Friction force microscopes / 61.16.Ch – Scanning probe microscopy: scanning tunneling, atomic force, magnetic, etc / 46.30.Pa – Friction, wear, adherence, hardness, mechanical contacts, and tribology
© EDP Sciences, 1996