Two-layer behaviour during low-energy ion ablation of CdTe(001) studied by in situ X-ray diffraction and by Monte Carlo simulation
Laboratoire de Minéralogie-Cristallographie, Université P. et M.
Curie, 4 place Jussieu, 75252 - Paris Cedex 05, France
2 Instituto de Física, Universidade Federal do Rio Grande do Sul, C.P. 15051, 91501-970 Porto Alegre, RS, Brazil
3 LURE, CNRS-MNJS-CEA, Bât 209-D - 91405 Orsay Cedex, France
4 Laboratoire de Spectrométrie Physique, CNRS, Université Joseph Fourier, BP 87, 38402 Grenoble Cedex, France
5 ESRF - BP 220, F-38043 Grenoble-Cedex, France
Corresponding author: firstname.lastname@example.org
Accepted: 12 September 1996
The evolution of the CdTe(001) surface during ion bombardment was studied by grazing incidence X-ray diffraction (GIXD) and by Monte Carlo simulation. A layer-by-layer removal was observed at which evolves to a step-flow mode above . An anisotropic relaxation of the surface lattice parameter and a long-distance correlation between islands along the direction were observed during sputtering.
PACS: 61.10.-i – X-ray diffraction and scattering / 82.65.Pa – Surface-enhanced molecular states and other gas-surface interactions / 68.35.Ja – Surface and interface dynamics and vibrations
© EDP Sciences, 1996