Kondo size effect in thin Cu(Mn) films
Department of Physics, Purdue University, West Lafayette, Indiana 47907-1396, USA
Accepted: 7 August 1998
We report an experimental study of the Kondo effect in thin Cu(Mn) films. Previous experiments with Au(Fe) and Cu(Fe) films have shown that in those systems the Kondo contribution to the resistivity, , becomes smaller as the film thickness, t, is reduced below about , and that it vanishes as . However, the behavior we find for Cu(Mn) is very different. In this case varies only weakly (and perhaps not at all) with t, and approaches a nonzero value as . These results are in good agreement with recent theoretical predictions of Zawadowski and coworkers.
PACS: 72.10.Di – Scattering by phonons, magnons, and other nonlocalized excitations / 72.15.Rn – Quantum localization / 73.20.Fz – Weak localization effects (e.g., quantized states)
© EDP Sciences, 1998