Simulation of atomic force microscopy of fractal nanostructured carbon films
INFM and Dipartimento di Scienza dei
Materiali, Università of Milano "Bicocca"via Cozzi 52, I-20126
2 INFM and Dipartimento di Fisica, Università di Cagliari Cittadella Universitaria, I-09042 Monserrato (CA), Italy
Accepted: 24 January 2001
The fractal properties of nanostructured carbon films as derived from atomic force microscopy are theoretically investigated by classical molecular dynamics. The non-trivial role of the tip radius in the experimental determination of the fractal exponents is elucidated.
PACS: 61.48.+c – Fullerenes and fullerene-related materials / 68.35.Ct – Interface structure and roughness / 61.46.+w – Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals
© EDP Sciences, 2001