Mound shape instability in multilayer homoepitaxy: The role of corner-crossing
INFM, Unità di Ricerca di Genova, Centro CFSBT-CNR
and Dipartimento di Fisica - Via Dodecaneso 33, I-16146
Corresponding author: firstname.lastname@example.org
Accepted: 19 February 2002
We have investigated the growth of in the multilayer regime by high-resolution electron diffraction (SPA-LEED). deposition at temperatures above 180 results in the growth of approximately square mounds with a predominant step termination which is thermodynamically favored. Surprisingly, when the deposition temperature is reduced below 130, instead of observing a random roughening of the step profile, as expected in a self-affine growth regime, the proliferation of oriented facets is observed. We attribute our observation to the de-activation of corner crossing, as well as to the presence of easy pathways for interlayer diffusion down the facets which are formed at steps.
PACS: 68.55.-a – Thin film structure and morphology / 61.14.Hg – Low-energy electron diffraction (LEED) and reflection high-energy electron diffraction (RHEED) / 68.35.Fx – Diffusion; interface formation
© EDP Sciences, 2002