Interface quality and short-range order of (001) superlattices as determined by CEMS
Department of Physics, Uppsala University - Box 530,
SE-751 21 Uppsala, Sweden
Corresponding author: firstname.lastname@example.org
Accepted: 16 September 2002
The dependence of the interface quality on growth temperature in (001) single-crystal multilayers was investigated using conversion electron Mössbauer spectroscopy (CEMS) and X-ray diffraction (xrd). The samples, with 7 atomic layers () of isotope-enriched and 5 of , were grown by dc magnetron sputtering onto (001) substrates at temperatures in the range 230–430. The xrd results confirmed the previous findings on optimum temperature for sharp interfaces (–330), whereas the CEMS data suggested that the short-range order was similar in all samples with . The film grown at 430 was significantly different, with clear signs of alloying throughout the layers. Additional magneto-optical measurements showed the expected ferromagnetic behaviour.
PACS: 68.35.Ct – Interface structure and roughness / 61.18.Fs – Magnetic resonance techniques; Mössbauer spectroscopy / 75.70.Cn – Interfacial magnetic properties (multilayers, superlattices)
© EDP Sciences, 2002