Europhys. Lett., 63 (6) , pp. 833-839 (2003)
Wall thickness and core radius determination in surfactant templated silica thin films using GISAXS and X-ray reflectivityA. Gibaud1, 2, A. Baptiste1, D. A. Doshi3, C. J. Brinker3, 2, L. Yang4 and B. Ocko4
1 Université du Maine, Faculté des Sciences - 72085 Le Mans Cedex 09, France
2 Sandia National Laboratory - Albuquerque, NM 87185, USA
3 University of New Mexico - Albuquerque, NM 87106, USA
4 Brookhaven National Laboratory - Upton Long Island, NY, 11987, USA
(Received 23 January 2003; accepted in final form 2 July 2003)
X-ray reflectometry and GISAXS (grazing angle small angle scattering) are combined to investigate the morphology and structural parameters of a surfactant templated 2D hexagonal thin-film silica mesophase. It is shown that X-ray reflectivity measurements contain invaluable information about the radius of the cylindrical rods and the distance between their cores. The reflectivity data are analyzed using a model of the electron density and combined with GISAXS measurements to derive the silica wall thickness.
61.10.Dp - Theories of diffraction and scattering.
81.07.Bc - Nanocrystalline materials.
68.35.Md - Surface thermodynamics, surface energies.
© EDP Sciences 2003