Europhys. Lett.
Volume 63, Number 6, September 2003
Page(s) 833 - 839
Section Condensed matter: structure, mechanical and thermal properties
Published online 01 November 2003
DOI: 10.1209/epl/i2003-00596-9
Europhys. Lett., 63 (6) , pp. 833-839 (2003)

Wall thickness and core radius determination in surfactant templated silica thin films using GISAXS and X-ray reflectivity

A. Gibaud1, 2, A. Baptiste1, D. A. Doshi3, C. J. Brinker3, 2, L. Yang4 and B. Ocko4

1  Université du Maine, Faculté des Sciences - 72085 Le Mans Cedex 09, France
2  Sandia National Laboratory - Albuquerque, NM 87185, USA
3  University of New Mexico - Albuquerque, NM 87106, USA
4  Brookhaven National Laboratory - Upton Long Island, NY, 11987, USA

(Received 23 January 2003; accepted in final form 2 July 2003)

X-ray reflectometry and GISAXS (grazing angle small angle scattering) are combined to investigate the morphology and structural parameters of a surfactant templated 2D hexagonal thin-film silica mesophase. It is shown that X-ray reflectivity measurements contain invaluable information about the radius of the cylindrical rods and the distance between their cores. The reflectivity data are analyzed using a model of the electron density and combined with GISAXS measurements to derive the silica wall thickness.

61.10.Dp - Theories of diffraction and scattering.
81.07.Bc - Nanocrystalline materials.
68.35.Md - Surface thermodynamics, surface energies.

© EDP Sciences 2003