Europhys. Lett.
Volume 66, Number 5, June 2004
Page(s) 708 - 714
Section Condensed matter: electronic structure, electrical, magnetic, and optical properties
Published online 01 May 2004
Europhys. Lett., 66 (5) , pp. 708-714 (2004)
DOI: 10.1209/epl/i2004-10024-x

Low-frequency current noise of the single-electron shuttle

A. Isacsson1, 2 and T. Nord1

1  Department of Applied Physics, Chalmers University of Technology and Göteborg University - SE-412 96 Göteborg, Sweden
2  Department of Physics, Yale University - P.O. Box 208120 New Haven, CT 06520-8120, USA

(Received 9 February 2004; accepted in final form 30 March 2004)

Coupling between electronic and mechanical degrees of freedom in a single-electron shuttle system can cause a mechanical instability leading to shuttle transport of electrons between external leads. We predict that the resulting low-frequency current noise can be enhanced due to slow fluctuations of the shuttle oscillation energy. Moreover, at the onset of mechanical instability a pronounced peak in the low-frequency noise is expected.

73.23.Hk - Coulomb blockade; single-electron tunneling.
72.70.+m - Noise processes and phenomena.
85.85.+j - Micro- and nano-electromechanical systems (MEMS/NEMS) and devices.

© EDP Sciences 2004