Low-frequency current noise of the single-electron shuttleA. Isacsson1, 2 and T. Nord1
1 Department of Applied Physics, Chalmers University of Technology and Göteborg University - SE-412 96 Göteborg, Sweden
2 Department of Physics, Yale University - P.O. Box 208120 New Haven, CT 06520-8120, USA
(Received 9 February 2004; accepted in final form 30 March 2004)
Coupling between electronic and mechanical degrees of freedom in a single-electron shuttle system can cause a mechanical instability leading to shuttle transport of electrons between external leads. We predict that the resulting low-frequency current noise can be enhanced due to slow fluctuations of the shuttle oscillation energy. Moreover, at the onset of mechanical instability a pronounced peak in the low-frequency noise is expected.
73.23.Hk - Coulomb blockade; single-electron tunneling.
72.70.+m - Noise processes and phenomena.
85.85.+j - Micro- and nano-electromechanical systems (MEMS/NEMS) and devices.
© EDP Sciences 2004