Matrix analysis of an anisotropic optical thin filmH. J. Qi1, 2, D. P. Zhang1, 2, J. D. Shao1 and Z. X. Fan1
1 Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences Shanghai 201800, PRC
2 Graduate School of the Chinese Academy of Sciences - Beijing 100864, PRC
received 26 November 2004; accepted in final form 9 March 2005
published online 25 March 2005
Based on Maxwell's equations, standard boundary conditions are imposed on resultant electric- and magnetic-field vectors at interfaces, and the propagating characteristics of extraordinary waves, such as the forward- and backward-propagating directions of wave vectors, rays and their corresponding refractive indices are determined in a uniaxially birefringent thin film. Furthermore, characteristic matrices of a birefringent thin film are derived including multiple reflections for the extraordinary wave.
78.20.Fm - Birefringence.
78.20.Ci - Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity).
77.55.+f - Dielectric thin films.
© EDP Sciences 2005