Europhys. Lett.
Volume 70, Number 2, April 2005
Page(s) 257 - 263
Section Condensed matter: electronic structure, electrical, magnetic, and optical properties
Published online 25 March 2005
Europhys. Lett., 70 (2), pp. 257-263 (2005)
DOI: 10.1209/epl/i2004-10490-0

Matrix analysis of an anisotropic optical thin film

H. J. Qi1, 2, D. P. Zhang1, 2, J. D. Shao1 and Z. X. Fan1

1  Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences Shanghai 201800, PRC
2  Graduate School of the Chinese Academy of Sciences - Beijing 100864, PRC

received 26 November 2004; accepted in final form 9 March 2005
published online 25 March 2005

Based on Maxwell's equations, standard boundary conditions are imposed on resultant electric- and magnetic-field vectors at interfaces, and the propagating characteristics of extraordinary waves, such as the forward- and backward-propagating directions of wave vectors, rays and their corresponding refractive indices are determined in a uniaxially birefringent thin film. Furthermore, $2\times2$ characteristic matrices of a birefringent thin film are derived including multiple reflections for the extraordinary wave.

78.20.Fm - Birefringence.
78.20.Ci - Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity).
77.55.+f - Dielectric thin films.

© EDP Sciences 2005