Volume 72, Number 6, December 2005
|Page(s)||976 - 982|
|Section||Condensed matter: structural, mechanical and thermal properties|
|Published online||23 November 2005|
Biaxiality and temperature dependence of - and -layer intermediate smectic-phase structures as revealed by resonant -ray scattering
School of Physics and Astronomy, University of Manchester Manchester, M13 1PL, UK
2 Department of Physics, Florida State University Tallahassee, FL 32306-4350, USA
3 School of Physics and Astronomy, University of Minnesota Minneapolis, MN 55455, USA
4 Brookhaven National Lab, NSLS - Upton, NY 11973, USA
Accepted: 19 October 2005
High-resolution resonant X-ray diffraction experiments have been performed on free-standing films of two selenium-containing antiferroelectric liquid-crystal mixtures. Optical studies had indicated that both mixtures exhibit exceptionally wide intermediate phases, over a total range of . Through the structural information obtained from the resonant scattering data, we confirm that the intermediate phases of these mixtures show both 3-layer and 4-layer structural periodicities. Moreover, due to the stability of these phases, we report for the first time the temperature dependence of both the helicoidal pitch and distortion angle in the 3-layer phases deduced using the resonant X-ray technique. Analysis using an extension of the theory set out by Levelut and Pansu (Levelut A-M. and Pansu B., Phys. Rev. E, 60 (1999) 6803) shows that over the temperature ranges measured, the pitch changes linearly as a function of temperature whilst the distortion angle remains constant.
PACS: 61.30.Eb – Experimental determinations of smectic, nematic, cholesteric, and other structures / 78.70.Ck – X-ray scattering / 83.80.Xz – Liquid crystals: nematic, cholesteric, smectic, discotic, etc
© EDP Sciences, 2005
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