Europhys. Lett.
Volume 74, Number 4, May 2006
Page(s) 665 - 671
Section Condensed matter: structural, mechanical and thermal properties
Published online 14 April 2006
Europhys. Lett., 74 (4), pp. 665-671 (2006)
DOI: 10.1209/epl/i2006-10026-8

Evolution of interface patterns of three-dimensional two-layer liquid films

A. Pototsky1, M. Bestehorn1, D. Merkt1 and U. Thiele2

1  Lehrstuhl für Theoretische Physik II, Brandenburgische Technische Universität Cottbus - Erich-Weinert-Straße 1, D-03046 Cottbus, Germany
2  Max-Planck-Institut für Physik komplexer Systeme - Nöthnitzer Straße 38 D-01187 Dresden, Germany

received 18 January 2006; accepted in final form 27 March 2006
published online 14 April 2006

The structuring process of two-layer liquid films driven by van der Waals interactions is investigated numerically for three-dimensional systems. Different types of dynamical transitions of the interface morphologies are characterised using coupled evolution equations for the thickness profiles. We introduce a global deflection measure that faithfully captures the transitions occurring in the course of the short- and long-time evolution. Using an Si/PMMA/PS/air system as example, transitions via branch switching and via coarsening are analysed in detail.

68.15.+e - Liquid thin films.
81.16.Rf - Nanoscale pattern formation.
68.55.-a - Thin film structure and morphology.

© EDP Sciences 2006