Evolution of interface patterns of three-dimensional two-layer liquid filmsA. Pototsky1, M. Bestehorn1, D. Merkt1 and U. Thiele2
1 Lehrstuhl für Theoretische Physik II, Brandenburgische Technische Universität Cottbus - Erich-Weinert-Straße 1, D-03046 Cottbus, Germany
2 Max-Planck-Institut für Physik komplexer Systeme - Nöthnitzer Straße 38 D-01187 Dresden, Germany
received 18 January 2006; accepted in final form 27 March 2006
published online 14 April 2006
The structuring process of two-layer liquid films driven by van der Waals interactions is investigated numerically for three-dimensional systems. Different types of dynamical transitions of the interface morphologies are characterised using coupled evolution equations for the thickness profiles. We introduce a global deflection measure that faithfully captures the transitions occurring in the course of the short- and long-time evolution. Using an Si/PMMA/PS/air system as example, transitions via branch switching and via coarsening are analysed in detail.
68.15.+e - Liquid thin films.
81.16.Rf - Nanoscale pattern formation.
68.55.-a - Thin film structure and morphology.
© EDP Sciences 2006