Issue
EPL
Volume 81, Number 1, January 2008
Article Number 17005
Number of page(s) 6
Section Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties
DOI http://dx.doi.org/10.1209/0295-5075/81/17005
Published online 20 November 2007
EPL, 81 (2008) 17005
DOI: 10.1209/0295-5075/81/17005

Magnetic coupling in highly ordered NiO/Fe3O4(110): Ultrasharp magnetic interfaces vs. long-range magnetoelastic interactions

I. P. Krug1, F. U. Hillebrecht1, H. Gomonaj2, M. W. Haverkort2, A. Tanaka3, L. H. Tjeng4 and C. M. Schneider1

1  Institut für Festkörperforschung IFF-9, Forschungszentrum Jülich GmbH - 52425 Jülich, Germany
2  Bogolyubov Institute for Theoretical Physics NAS of Ukraine - st. Metrologichna, 14-b, 03143, Kiev, Ukraine
3  Department of Quantum Matter, ADSM, Hiroshima University - Higashi-Hiroshima, 739-8530, Japan
4  Physikalisches Institut II, Universität zu Köln - 50937 Köln, Germany

i.krug@fz-juelich.de

received 22 August 2007; accepted in final form 28 October 2007; published January 2008
published online 20 November 2007

Abstract
We present a laterally resolved X-ray magnetic dichroism study of the magnetic proximity effect in a highly ordered oxide system, i.e. NiO films on Fe3O4(110). We found that the magnetic interface shows an ultrasharp electronic, magnetic and structural transition from the ferrimagnet to the antiferromagnet. The monolayer which forms the interface reconstructs to NiFe2O4 and exhibits an enhanced Fe and Ni orbital moment, possibly caused by bonding anisotropy or electronic interaction between Fe and Ni cations. The absence of spin-flop coupling for this crystallographic orientation can be explained by a structurally uncompensated interface and additional magnetoelastic effects.

PACS
75.70.Cn - Magnetic properties of interfaces (multilayers, superlattices, heterostructures).
75.70.Ak - Magnetic properties of monolayers and thin films.
75.25.+z - Spin arrangements in magnetically ordered materials (including neutron and spin-polarized electron studies, synchrotron-source X-ray scattering, etc.).

© EPLA 2008