Volume 83, Number 5, September 2008
Article Number 57007
Number of page(s) 5
Section Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties
Published online 03 September 2008
EPL, 83 (2008) 57007
DOI: 10.1209/0295-5075/83/57007

New results for the dependence of the magnetoresistance of magnetic multilayers on the layer thickness

L. A. Michez1, B. J. Hickey1, Smadar Shatz2 and Nathan Wiser2

1   School of Physics and Astronomy, E.C. Stoner Laboratory, University of Leeds - Leeds LS2 9JT, UK, EU
2   Department of Physics, Bar-Ilan University - Ramat-Gan, Israel

received 25 September 2007; accepted in final form 20 July 2008; published September 2008
published online 3 September 2008

We measured the dependence of the giant magnetoresistance on the thickness of the magnetic layers for a magnetic multilayer comprising two types of magnetic layers, oriented in the CPP mode (current perpendicular to the plane of the layers). The thickness dependence was found to be very different for thin and thick multilayers and for the interleaved and the separated configurations. An explanation for these differences is presented.

75.70.Cn - Magnetic properties of interfaces (multilayers, superlattices, heterostructures).
73.40.-c - Electronic transport in interface structures.
75.47.De - Giant magnetoresistance.

© EPLA 2008