Volume 84, Number 4, November 2008
Article Number 47002
Number of page(s) 3
Section Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties
Published online 10 November 2008
EPL, 84 (2008) 47002
DOI: 10.1209/0295-5075/84/47002

Structural properties and phase transition of RFeMO (R = La, Nd; M = As, P) materials

C. Ma, L. J. Zeng, H. X. Yang, H. L. Shi, R. C. Che, C. Y. Liang, Y. B. Qin, G. F. Chen, Z. A. Ren and J. Q. Li

Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences - Beijing 100080, China

received 4 August 2008; accepted in final form 5 October 2008; published November 2008
published online 10 November 2008

The structural properties of RFeMO (R = La, Nd; M = As, P) materials were analyzed by transmission electron microscopy (TEM), revealing that the layered RFeMO crystals often contain a variety of structural defects, such as stacking faults and small-angle boundaries. In situ TEM observations revealed a remarkable spin density wave (SDW) instability near 150 K, and associated complex structural transitions can be clearly observed in both crystalline symmetry and local microstructural features.

74.70.Dd - Ternary, quaternary, and multinary compounds (including Chevrel phases, borocarbides, etc.).
61.72.Ff - Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, X-ray topography, etc.).
61.05.J- - Electron diffraction and scattering.

© EPLA 2008