Morphological stability of epitaxy films on pre-strained substrates
CAS Key Laboratory of Mechanical Behavior and Design of Materials, University of Science and Technology of China Hefei, Anhui 230026, PRC
Corresponding author: email@example.com
Accepted: 14 April 2010
We perform a linear stability analysis of coherent epitaxy films on pre-strained substrates by incorporating the effect of long-range forces. We show that a proper pre-strain can increase or decrease the critical thickness and alter the fastest-growing unstable mode of the film. The result may provide a mechanism to control the morphology of the films in a mechanical way.
PACS: 68.55.J- – Morphology of films / 68.35.Ct – Interface structure and roughness / 68.47.Fg – Semiconductor surfaces
© EPLA, 2010