Issue |
Europhys. Lett.
Volume 60, Number 2, October 2002
|
|
---|---|---|
Page(s) | 323 - 328 | |
Section | Interdisciplinary physics and relates areas of science and technology | |
DOI | https://doi.org/10.1209/epl/i2002-00353-8 | |
Published online | 01 October 2002 |
Suppression of UV photoluminescence
in sandwich-structured
composite films
Department of Physics, Block 12, Faculty of Science, National University of Singapore 2 Science Drive 3, Singapore 117542
Corresponding author: phyongpp@nus.edu.sg
Received:
22
May
2002
Accepted:
2
August
2002
Thin films of composite silicon/carbon () were
prepared by pulsed-laser ablation alternately on
and
materials on a rotary target, followed by vacuum
deposition of the ablated materials on an ultra-clean glass
substrate. The film structure consisted of alternate nanolayers
of
nanocrystals and amorphous
, with a fairly
sharp demarcation boundary between adjacent layers forming
well-defined sandwich structures. At room temperature, this
composite nanolayered structure was found to yield much lower
photoluminescent (PL) emission in the ultra violet region
(300–390
) in comparison with that obtained for pure
or for
thin films (see Zhu Y., Wang H. and Ong P. P.
J. Phys. D, 33 (2000) 1965, and
Zhu Y. and Ong P. P.
J. Phys. Condens.
Matter, 13 (2001) L1). The suppression mechanism of the UV PL
emission appeared to occur in the interfacial surfaces between
adjacent crystalline
and amorphous
layers. It
provides a possible way to selectively filter out the usually
undesirable UV component of the PL emission from the silicon
nanoparticles.
PACS: 81.07.-b – Nanoscale materials and structures: fabrication and characterization / 78.55.Ap – Elemental semiconductors
© EDP Sciences, 2002
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